Comparison of measured BRDF data with parameterized reflectance models

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4370, Issue , 2001, Pages 159-168

  Watson, Rupert M J ^a   Raven, Peter N ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

Bidirectional reflectance; BRDF; Image modelling; Infrared; Scene simulation; Surface scattering; Visible

Indexed keywords

COMPUTER SIMULATION; IMAGING SYSTEMS; INFRARED IMAGING; LIGHT EMISSION; LIGHT REFLECTION; OPTICAL MATERIALS; SURFACE PROPERTIES;

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTIONS (BRDF);

IMAGE ANALYSIS;

EID: 0035758417     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.440073     Document Type: Article

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