메뉴 건너뛰기




Volumn , Issue , 2007, Pages 555-558

Mechanical properties of electrodeposited permalloy thin film measured by using a tensile test

Author keywords

Mechanical properties; Permalloy; Tensile test; Thin Film

Indexed keywords

ACTUATORS; COMPOSITE MICROMECHANICS; COPPER PLATING; ELECTROPLATING; FRACTURE FIXATION; MACHINE DESIGN; MAGNETIC MATERIALS; MATERIALS PROPERTIES; MICROELECTROMECHANICAL DEVICES; MICROSYSTEMS; NICKEL; SENSORS; SOFT MAGNETIC MATERIALS; TENSILE TESTING; THICK FILMS; TRANSDUCERS;

EID: 50049102427     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2007.4300190     Document Type: Conference Paper
Times cited : (11)

References (7)
  • 2
    • 0001651737 scopus 로고    scopus 로고
    • Electrodeposited iron group thin-film alloys: Structure-property relationships
    • N.V. Myung, K. Nobe, "Electrodeposited iron group thin-film alloys: structure-property relationships", Journal of The Electrochemical Society, Vol. 148, pp. 136-144, 2001.
    • (2001) Journal of The Electrochemical Society , vol.148 , pp. 136-144
    • Myung, N.V.1    Nobe, K.2
  • 4
    • 0031081872 scopus 로고    scopus 로고
    • Design and fabrication of current-pulse-excited bistable magnetic microactuator
    • H. Ren, E. Gerhard, "Design and fabrication of current-pulse-excited bistable magnetic microactuator", Sensors and Actuators A, Vol. 58, pp. 259-264, 1997.
    • (1997) Sensors and Actuators A , vol.58 , pp. 259-264
    • Ren, H.1    Gerhard, E.2
  • 5
    • 0030247956 scopus 로고    scopus 로고
    • Comparison of mechanical and tribological properties of permalloy and high moment FeTaN thin films for tape recording heads
    • H. Deng, M. Kevin, John A. Barnard, "Comparison of mechanical and tribological properties of permalloy and high moment FeTaN thin films for tape recording heads", IEEE Transaction on Magnetics, Vol. 32, pp. 3702-3704, 1996.
    • (1996) IEEE Transaction on Magnetics , vol.32 , pp. 3702-3704
    • Deng, H.1    Kevin, M.2    John, A.3    Barnard4
  • 6
    • 0042638058 scopus 로고    scopus 로고
    • Tensile testing of silicon film having different crystallographic orientations carried out on a silicon chip
    • K. Sato, T. Yoshioka, T. Ando, M. Shikida, T. Kawabata, "Tensile testing of silicon film having different crystallographic orientations carried out on a silicon chip", Sensors and Actuators A, Vol. 70, pp. 148-152, 1998.
    • (1998) Sensors and Actuators A , vol.70 , pp. 148-152
    • Sato, K.1    Yoshioka, T.2    Ando, T.3    Shikida, M.4    Kawabata, T.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.