Structural characterization and porosity analysis in spin coated silica thin films as gas selective membranes

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 10, 2007, Pages 3823-3826

  Mariazzi, S ^a   Patel, N ^a   Toniutti, L ^a   Checchetto, R ^a   Miotello, A ^a   Brusa, R S ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DOPPLER BROADENING; FOURIER TRANSFORM INFRARED; INFRA-RED; INTERNATIONAL CONFERENCES; MICROPOROUS SILICA; POLY-VINYL-PYRROLIDONE; POROGEN; POSITRON ANNIHILATION LINE; SELECTIVE MEMBRANES; SI SUBSTRATE; SILICA SOLS; SILICA THIN FILMS; SPIN COATINGS; STRUCTURAL CHARACTERIZATIONS; WATER CONCENTRATIONS;

ANNEALING; CLADDING (COATING); COLLOIDS; CONCENTRATION (PROCESS); ELECTRONS; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; INFRARED SPECTROSCOPY; LIQUID PHASE EPITAXY; MOLECULAR BEAM EPITAXY; POROSITY; POROUS SILICON; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; SILICA; SILICATE MINERALS; SILICON; SILICON COMPOUNDS; SOLS; SPECTROSCOPIC ANALYSIS; SPIN COATING; SPIN DYNAMICS; SUPERCONDUCTING MATERIALS; THICK FILMS; THIN FILMS;

POSITRONS;

EID: 49949097288     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200675785     Document Type: Conference Paper

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