Stabilizing method for reflection interference contrast microscopy

Applied Optics

Volumn 47, Issue 12, 2008, Pages 2070-2075

  Kim, Kipom ^a   Saleh, Omar A ^a,b  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK CONTROL; MICROSCOPIC EXAMINATION;

BIOPHYSICAL APPLICATIONS; DEFOCUSING EFFECTS; INDEPENDENT MEASUREMENT; MICROSCOPIC OBJECTS; REFLECTION INTERFERENCE CONTRAST MICROSCOPIES; STABILIZING METHODS; STANDARD DEVIATION; VERTICAL POSITIONS;

FEEDBACK;

POLYSTYRENE DERIVATIVE;

ALGORITHM; ARTICLE; BIOPHYSICS; CHEMISTRY; EQUIPMENT DESIGN; HEAT; MECHANICAL STRESS; METHODOLOGY; MICROSCOPY; OPTICS; PHASE CONTRAST MICROSCOPY; STATISTICAL MODEL; TIME;

ALGORITHMS; BIOPHYSICS; EQUIPMENT DESIGN; HEAT; MICROSCOPY; MICROSCOPY, INTERFERENCE; MICROSCOPY, PHASE-CONTRAST; MODELS, STATISTICAL; OPTICS; POLYSTYRENES; STRESS, MECHANICAL; TIME FACTORS;

EID: 49949088656     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.002070     Document Type: Article

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