Dependence of minimum operating voltage (VDDmin) on block size of 90-nm CMOS ring oscillators and its implications in low power DFM

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Volumn , Issue , 2008, Pages 133-136

  Niiyama, Taro ^a   Zhe, Piao ^a   Ishida, Koichi ^a   Murakata, Masami ^b   Takamiya, Makoto ^a   Sakurai, Takayasu ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b STARC ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DESIGNS; INTERNATIONAL SYMPOSIUM; OPERATING VOLTAGES;

ELECTRONICS ENGINEERING;

EID: 49749084887     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479713     Document Type: Conference Paper

References (6)

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6. J. Tschanz, J. Kao, S. Narendra, R. Nair, D. Antoniadis, A. Chandrakasan, and V. De, "Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage," IEEE Journal of Solid-State Circuits, Vol. 37, No. 11, pp. 1396-1402, Nov. 2002.