A low-power true random number generator using random telegraph noise of single oxide-traps

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2006, Pages

  Brederlow, Ralf ^a   Prakash, Ramesh ^b   Paulus, Christian ^c   Thewes, Roland ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b Agere Systems   (United States)

^c SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

RANDOM TELEGRAPH; SINGLE OXIDE TRAPS;

CMOS INTEGRATED CIRCUITS; MOSFET DEVICES; REDUNDANCY; SPURIOUS SIGNAL NOISE; VOLTAGE CONTROL;

RANDOM NUMBER GENERATION;

EID: 39749188329     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)