True random number generator with a metastability-based quality control

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2007, Pages 404-406

  Tokunaga, Carlos ^a   Blaauw, David ^a   Mudge, Trevor ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY SEQUENCES; QUALITY CONTROL; RANDOM PROCESSES; SPURIOUS SIGNAL NOISE;

BIT VALUE; METASTABILITY; RANDOMNESS; RESOLUTION TIME;

RANDOM NUMBER GENERATION;

EID: 34548813069     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2007.373465     Document Type: Conference Paper

References (5)

1. R. Brederlow, R. Prakash, C. Paulus, R. Thewes, "A Low-Power True Random Number Generator Using the Random Telegraph Noise of Single Oxide-Traps," ISSCC Dig. Tech. Papers, pp. 536-537, Feb., 2006.
2. B. Jun and P. Krocher, "The Intel Random Number Generator," White Paper, http://www.cryptography.com/intelRNG.pdf, 1999.
3. D. Kinniment and E. Chester, "Design of an On-Chip Random Number Generator using Metastability," Proc. European Solid-State Circuit Conf., pp. 595-598, Sep., 2002.
4. P. Gray, P. Hurst, S. Lewis, R. Meyer, Analysis and Design of Analog Integrated Circuits, 4th Ed., pp. 759, John Wiley & Sons, Inc., 2000.
5. National Institute of Standards and Technology, "A Statistical Test Suite for the Validation of Random Number Generators and Pseudo Random Number Generators for Cryptographic Applications," Pub 800-22, 2001.