A rigorous study of measurement techniques for negative bias temperature instability

IEEE International Integrated Reliability Workshop Final Report

Volumn , Issue , 2007, Pages 6-11

  Grasser, Tibor ^a   Wagner, Paul Jürgen ^a   Hehenberger, Philipp ^a   Gös, Wolfgang ^a   Kaczer, Ben ^b  

^a INSTITUTE FOR MICROELECTRONICS   (Austria)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; MOSFET DEVICES; NEGATIVE TEMPERATURE COEFFICIENT; THERMODYNAMIC STABILITY; THRESHOLD VOLTAGE;

ACCURATE MEASUREMENT; COMPACT MODEL; CONDITION; LINEAR DRAIN CURRENT; MEASUREMENT TECHNIQUES; ON-THE-FLY METHODS; PMOSFET; SIMPLE++; THRESHOLD-VOLTAGE SHIFT;

NEGATIVE BIAS TEMPERATURE INSTABILITY;

EID: 49549095752     PISSN: 19308841     EISSN: 23748036     Source Type: Conference Proceeding    
DOI: 10.1109/IRWS.2007.4469212     Document Type: Conference Paper

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