Nanoscale modification of electrical and magnetic properties of Fe 3O4 thin film by atomic force microscopy lithography

Applied Physics Letters

Volumn 85, Issue 10, 2004, Pages 1811-1813

  Hirooka, Motoyuki ^a   Tanaka, Hidekazu ^b   Li, Runwei ^a   Kawai, Tomoji ^a  

^a OSAKA UNIVERSITY   (Japan)

^b Japan Science and Technology Agency   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FERRIMAGNETISM; FILM GROWTH; MAGNETIC PROPERTIES; MAGNETITE; MAGNETIZATION; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; SUBSTRATES; ULTRATHIN FILMS;

MAGNETIC FORCE MICROSCOPY; NANOPATTERNING; NANOWIRES; PHASE DETECTION;

LITHOGRAPHY;

EID: 4944262723     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1784884     Document Type: Article

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