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Volumn 93, Issue 10 2, 2003, Pages 7346-7348
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Applied voltage dependence of nano-oxidation of ferromagnetic thin films using atomic force microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC FIELDS;
FERROMAGNETIC MATERIALS;
NANOSTRUCTURED MATERIALS;
OXIDATION;
VOLTAGE DEPENDENCE;
MAGNETIC THIN FILMS;
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EID: 0038313005
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1540046 Document Type: Conference Paper |
Times cited : (15)
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References (14)
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