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Volumn 93, Issue 10 2, 2003, Pages 7346-7348

Applied voltage dependence of nano-oxidation of ferromagnetic thin films using atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FERROMAGNETIC MATERIALS; NANOSTRUCTURED MATERIALS; OXIDATION;

EID: 0038313005     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1540046     Document Type: Conference Paper
Times cited : (15)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.