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Volumn 5, Issue 1, 2003, Pages 72-75
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Synthesis, morphology and electrical characterization of Ag-TCNQ - From thin film to nanowire
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
ELECTRON BEAM LITHOGRAPHY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
SCANNING TUNNELING MICROSCOPY;
SILVER;
SYNTHESIS (CHEMICAL);
THIN FILMS;
THRESHOLD VOLTAGE;
ELECTRICAL MEMORY EFFECT;
NANOWIRES;
SWITCHING VOLTAGE THRESHOLD;
TETRACYANOQUINODIMETHANE;
ORGANOMETALLICS;
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EID: 4944237480
PISSN: 16065131
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (21)
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References (15)
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