Characterization and electrical switching properties of Cu-tetracyanoquinodimethane films formed under different conditions

Journal of Materials Science Letters

Volumn 17, Issue 9, 1998, Pages 719-721

  Sun, Shuqing ^a   Xu, Xiaoyin ^b   Wu, Peiji ^a   Zhu, Daoben ^a  

^a INSTITUTE OF CHEMISTRY   (China)

^b CAPITAL MEDICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARGE TRANSFER; COPPER COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; MORPHOLOGY; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELECTRICAL SWITCHING; TETRACYANOQUINODIMETHANE;

CONDUCTIVE FILMS;

EID: 0032070327     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006642307750     Document Type: Article

References (12)

1. S. R. OVSHINSKY, Phys. Rev. Lett. 21 (1968) 1450.
2. R. S. POTEMBER, T. O. POEHLER and D. O. COWAN, Appl. Phys. Lett. 36 (1979) 405.
3. J. GONG and Y. OSADA, ibid. 61 (1992) 2787.
4. S. Q. SUN, P. J. WU and D. B. ZHU, Thin Solid Films 301 (1997) 192.
5. Idem, Solid St. Commun. 99 (1996) 277.
6. C. SATO, S. WAKAMATSU, K. TADOKORO and K. ISHII, J. Appl. Phys. 68 (1990) 6535.
7. E. I. KAMITSOS and W. M. RISON JR, Molec. Cryst. Liq. Cryst. 134 (1986) 31.
8. R. S. POTEMBER, R. C. HOFFMAN and T. O. POEHLER, John Hopkins APL Tech. Dig. 7 (1986) 129.
9. E. I. KAMITSOS, C. H. TZIMIS and W. M. RISEN JR, Solid St. Commun. 42 (1982) 561.
10. R. C. BENSON and R. S. POTEMBER, Appl. Opt. 28 (1989) 1417.
11. J. J. HOAGLAND, X. D. WANG and K. W. HIPPS, Chem. Mater. 5 (1993) 54.
12. L. SHIEEDS, J. Chem. Soc., Faraday Trans. Ser. 2 181 (1985) 1.