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Volumn 96, Issue 5, 2004, Pages 2684-2688

Characterization of sulfur passivated n-GaSb using transmission electron microscopy and the influence of passivation on ohmic contact resistance

(2) Robinson, J A a Mohney, S E a

a PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOOSTER CELLS; SURFACE PREPARATION; SURFACE STABILITY; THERMOPHOTOVOLTAIC DEVICES;

AMORPHOUS MATERIALS; CRYSTALLINE MATERIALS; ELECTRIC RESISTANCE; METALLIZING; NANOSTRUCTURED MATERIALS; OHMIC CONTACTS; QUANTUM EFFICIENCY; SEMICONDUCTING GALLIUM COMPOUNDS; SULFUR; SUPERLATTICES; THRESHOLD VOLTAGE; TRANSMISSION ELECTRON MICROSCOPY;

PASSIVATION;

EID: 4944235381 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1776641 Document Type: Article

Times cited : (27)

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