An analysis of single event upset dependencies on high frequency and architectural implementations within Actel RTAX-S family field programmable gate arrays

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3569-3574

  Berg, Melanie ^a   Wang, Jih Jong ^b   Ladbury, Ray ^a   Buchner, Steve ^a   Kim, Hak ^a   Howard, Jim ^a   LaBel, Ken ^a   Phan, Anthony ^a   Irwin, Tim ^a   Friendlich, Mark ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b Actel Corp   (United States)

Author keywords

Actel; Anti fuse; FPGA; High frequency; Single event upsets; TMR; Transients

Indexed keywords

GATES (TRANSISTOR); LOGIC DEVICES;

ACTEL; EVENT UPSET DEPENDENCIES; HIGH SPEED TESTING; SINGLE EVENT UPSETS;

FIELD PROGRAMMABLE GATE ARRAYS;

EID: 33846387083     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.886043     Document Type: Conference Paper

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