An XPS study on N doped TiO2 sol-gel thin films

Proceedings of the International Semiconductor Conference, CAS

Volumn 2, Issue , 2007, Pages 353-356

  Osiceanu, P ^a   Anastasescu, M ^a   Anastasescu, C ^a   Trapalis, Chr ^b   Giannakopoulout, T ^b   Todorova, N ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Romania)

^b INSTITUTE OF MATERIALS SCIENCE   (Greece)

Author keywords

Multilayered N doped TiO2; Sol gel; Ti O N chemical bonding; XPS

Indexed keywords

ELECTRIC CONDUCTIVITY; X RAY PHOTOELECTRON SPECTROSCOPY;

MULTILAYERED N-DOPED TIO2; N DOPING; SOL-GEL; TI-O-N CHEMICAL BONDING; XPS;

SEMICONDUCTOR MATERIALS;

EID: 49149116686     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMICND.2007.4519733     Document Type: Conference Paper

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