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Volumn 82, Issue 12, 2008, Pages 1470-1474
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Effect of the microstructure on the cutting performance of superhard (Ti,Si,Al)N nanocomposite films
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Author keywords
(Ti,Si,Al)N; HRTEM; Microstructure; XRD
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Indexed keywords
ALUMINUM;
DEPOSITION RATES;
FIBER OPTICS;
HIGH RESOLUTION ELECTRON MICROSCOPY;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
IMAGE ENHANCEMENT;
MAGNETRON SPUTTERING;
MAGNETRONS;
MICROCRYSTALLINE SILICON;
MICROSTRUCTURE;
NANOCOMPOSITES;
NANOSTRUCTURED MATERIALS;
REACTIVE SPUTTERING;
SILICON;
SPUTTER DEPOSITION;
TIN;
TITANIUM COMPOUNDS;
TITANIUM NITRIDE;
TUNGSTEN CARBIDE;
X RAY ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
(TI,SI,AL)N;
ASYMMETRIC MODES;
BRIGHT-FIELD IMAGES;
COLUMNAR STRUCTURES;
CUTTING PERFORMANCES;
DEPOSITION CHAMBERS;
FIBER TEXTURES;
HIGH-DEPOSITION RATES;
HRTEM;
HRTEM IMAGES;
MULTILAYER STACKING;
N COATINGS;
NANO-COMPOSITE FILMS;
REACTIVE MAGNETRON SPUTTERING;
ROCKING CURVES;
SUPERHARD;
X-RAY DIFFRACTION;
XRD;
CUTTING TOOLS;
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EID: 49149084265
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2008.03.050 Document Type: Article |
Times cited : (18)
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References (27)
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