Real time and in situ control of the gap size of nanoelectrodes for molecular devices

Nano Letters

Volumn 8, Issue 6, 2008, Pages 1625-1630

  Wei, Dacheng ^a,b   Liu, Yunqi ^a   Cao, Lingchao ^a,b   Wang, Yu ^a,b   Zhang, Hongliang ^a,b   Yu, Gui ^a  

^a PEKING UNIVERSITY   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRODES; MOLECULAR ELECTRONICS; NUCLEIC ACIDS; SCANNING ELECTRON MICROSCOPY;

CURRENT-VOLTAGE MEASUREMENTS; DNA MOLECULES; GAP SIZES; IN-SITU; IN-SITU CONTROLS; INDUCED DEPOSITIONS; MOLECULAR DEVICES; NANO-ELECTRODES; NONDESTRUCTIVE PROCESS; REAL TIME; SIMPLE METHODS; STACKING INTERACTIONS;

AMORPHOUS CARBON;

ARTICLE; COMPUTER SYSTEM; ELECTROCHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY;

COMPUTER SYSTEMS; ELECTROCHEMISTRY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MICROELECTRODES; NANOTECHNOLOGY;

EID: 48449095997     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl080283+     Document Type: Article

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