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Volumn 3, Issue 1, 2007, Pages 86-90

Sub-5-nm gaps prepared by on-wire lithography: Correlating gap size with electrical transport

(4) Qin, Lidong a Jang, Jae Won a Huang, Ling a Mirkin, Chad A a

a NORTHWESTERN UNIVERSITY (United States)

Author keywords

Electrodes; Nanolithography; Nanowires; Template synthesis; Tunneling

Indexed keywords

ALUMINA; ANODES; ELECTRON TUNNELING; GOLD; NANOSTRUCTURED MATERIALS; SILICA;

ANODIC ALUMINUM OXIDE (AAO) TEMPLATE; ELECTRICAL TRANSPORT; NANOELECTRODES; ON-WIRE LITHOGRAPHY (OWL);

LITHOGRAPHY;

METAL; NANOMATERIAL;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRICITY; ELECTROCHEMISTRY; ELECTRON TRANSPORT; INSTRUMENTATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOGRAPHY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC WIRING; ELECTROCHEMISTRY; ELECTRON TRANSPORT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; METALS; MICROELECTRODES; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOGRAPHY; SURFACE PROPERTIES;

EID: 33846279833 PISSN: 16136810 EISSN: 16136829 Source Type: Journal
DOI: 10.1002/smll.200600386 Document Type: Review

Times cited : (43)

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