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Volumn 602, Issue 14, 2008, Pages 2368-2372

Spectral characterization of thin films of vanadyl hexadecafluorophthalocyanine VOPcF16

Author keywords

Ellipsometry; IR spectroscopy; Phthalocyanines; Raman scattering spectroscopy; Thin films

Indexed keywords

OPTICAL PROPERTIES; SEMICONDUCTING CADMIUM TELLURIDE; SPECTRUM ANALYZERS; STRUCTURAL PROPERTIES; THICK FILMS;

EID: 48149098619     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.04.044     Document Type: Article
Times cited : (18)

References (43)
  • 14
    • 0004162405 scopus 로고
    • Lehn J.M., and Rees Ch.W. (Eds), Springer-Verlag, Berlin
    • Simon J., and Andre J.-J. In: Lehn J.M., and Rees Ch.W. (Eds). Molecular Semiconductors (1985), Springer-Verlag, Berlin
    • (1985) Molecular Semiconductors
    • Simon, J.1    Andre, J.-J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.