An efficient control-oriented coverage metric

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1, Issue , 2005, Pages 317-322

  Verma, Shireesh ^a   Ramineni, Kiran ^a   Harris, Ian G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN;

COMPLEX CONTROL FLOW; CONTROL FLOWS; COVERAGE METRICS; DESIGN FAULTS; EFFICIENT CONTROL; HIGH-ACCURACY; TEST SEQUENCE; VALIDATION PROCESS;

FAULT DETECTION;

EID: 47949105638     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1120725.1120858     Document Type: Conference Paper

References (13)

1. B. Beizer. Software Testing Techniques, Second Edztzon. Van Nostrand Reinhold, 1990.
2. K.-T. Cheng and J.-Y. Jou. A functional fault model for sequentia.1 machines. IEEE Transactions on Computer-Aided Design, 11 (9): 1065-1073, September 1992.
3. F. Corno, M. S. Reorda', G. Squillero, A. Manzone, and A. Pincetti. Automatic test bench generation for validation of RT-level descriptions: an industrial experience. In Design Automation and Test in Europe, pages 385-389, 2000.
4. F. Fallah, S. Devadas, and K. Keutzer. Occom: Efficient computation of observability-based code coverage metrics for functional verification. In Design Automation Conference, pages 152-157, June 1998.
5. G. A. Hayek and C. Robach. From specification validation to hardware testing: A unified method. In International Test Conference., pages 885-893, October 1996.
6. K. N. King and A. J. Offutt. A fortran language system for mutation-based software testing. Software Practice and Engineering, 21(7):685-718, 1991.
7. J. Laski and B. Korel. A data flow oriented program testing strategy. IEEE Trans, on Software Engineering, SE-9:33-43, 1983.
8. T. Lv, J. Fan, and X. Li. An efficient observability evaluation algorithm based on factored use-def chains. In Asian Test Symposium, pages 161-166, 2003.
9. N. Malik, S. Roberts, A. Pita, and R. Dobson. Automaton: an autonomous coverage-based multiprocessor system .verification environment. In IEEE International Workshop on Rapid System Prototyping, pages 168-172, June 1997.
10. D. Moundanos, J. A. Abraham, and Y. V. Hoskote. Abstraction techniques for validation coverage analysis and test generation. IEEE Transactions on Computers, 47(1):2-14, January 1998.
11. R. Vemuri and R. Kalyanaraman. Generation of design verification tests from behavioral vhdl programs using path enumeration and constraint programming. IEEE Transactions on Very Large Scale Integration Systems, 3(2):201-214, 1995.
12. A. von Mayrhauser, T. Chen, J. Kok, C. Anderson, A. Read, and A. Hajjar. On choosing test criteria for behavioral level harware design verification. In High Level Design Validation and Test Workshop, pages 124-130, 2000.
13. Q. Zhang and I. G. Harris. A data flow fault coverage metric for validation of behavioral hdl descriptions. In International Conference on Computer-Aided Design, November 2000.