메뉴 건너뛰기




Volumn 2000-January, Issue , 2000, Pages 124-130

On choosing test criteria for behavioral level hardware design verification

Author keywords

Computer science; Design engineering; Hardware design languages; Power system modeling; Process design; Software design; Software testing; Standardization; System testing; Very large scale integration

Indexed keywords

COMPUTER HARDWARE; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SCIENCE; HARDWARE; INTEGRATION TESTING; MODELING LANGUAGES; PROCESS DESIGN; SOFTWARE TESTING; STANDARDIZATION; VLSI CIRCUITS;

EID: 0042781872     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2000.889572     Document Type: Conference Paper
Times cited : (14)

References (27)
  • 1
    • 0027983388 scopus 로고
    • Architectural Timing Verification and Test for Super Scalar Processors
    • June
    • P. Bose, "Architectural Timing Verification and Test for Super Scalar Processors", Proc. 24th Int. Symp. on Fault-Tolerant Computing, pp.256-265, June, 1994.
    • (1994) Proc. 24th Int. Symp. on Fault-Tolerant Computing , pp. 256-265
    • Bose, P.1
  • 2
    • 0021439084 scopus 로고
    • Functional Testing of Microprocessors
    • June
    • D. Brahme and J.A. Abraham, "Functional Testing of Microprocessors", IEEE Trans. on Computers, Vol.C-33, pp.475-485, June, 1984.
    • (1984) IEEE Trans. on Computers , vol.C-33 , pp. 475-485
    • Brahme, D.1    Abraham, J.A.2
  • 3
    • 0012069772 scopus 로고
    • B-Algorithm: A Behavioral Test Generation Algorithm
    • C.H. Cho and J.R. Armstrong, "B-Algorithm: A Behavioral Test Generation Algorithm", Proc. IEEE Int. Test Conf., pp.968-979, 1994.
    • (1994) Proc. IEEE Int. Test Conf. , pp. 968-979
    • Cho, C.H.1    Armstrong, J.R.2
  • 5
    • 0026222968 scopus 로고
    • Constraint-Based Automatic Test Data Generation
    • Sept.
    • DeMillo, R., A.; Offutt, A., J.; "Constraint-Based Automatic Test Data Generation", IEEE Transactions on Software Engineering SE-17, 9(Sept. 1991), p. 900-910.
    • (1991) IEEE Transactions on Software Engineering , vol.SE-17 , Issue.9 , pp. 900-910
    • DeMillo, R.A.1    Offutt, A.J.2
  • 7
    • 0020749255 scopus 로고
    • A Data Flow Oriented Program Testing Strategy
    • May
    • Laski, J., W.; Korel, B.; "A Data Flow Oriented Program Testing Strategy", IEEE Transactions on Software Engineering SE-9, 3(May 1983), p. 347-354.
    • (1983) IEEE Transactions on Software Engineering , vol.SE-9 , Issue.3 , pp. 347-354
    • Laski, J.W.1    Korel, B.2
  • 8
    • 0026676490 scopus 로고
    • Artest: An Architectural Level Test Generator for Data Path Faults and Control Faults
    • Sept.
    • J. Lee and J.H. Patel, "Artest: An Architectural Level Test Generator for Data Path Faults and Control Faults", Proc. of Int. Test Conf., pp.729-738. Sept. 1991.
    • (1991) Proc. of Int. Test Conf. , pp. 729-738
    • Lee, J.1    Patel, J.H.2
  • 9
    • 0020153890 scopus 로고
    • Test Generation Algorithms for Computer Hardware Description Languages
    • July
    • Y.H. Levendel and P.R. Menon, "Test Generation Algorithms for Computer Hardware Description Languages", IEEE Trans. on Computers, Vol. C-31, pp.577-588, July, 1982.
    • (1982) IEEE Trans. on Computers , vol.C-31 , pp. 577-588
    • Levendel, Y.H.1    Menon, P.R.2
  • 10
    • 0021578075 scopus 로고
    • Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Techniques
    • Oct.
    • T. Lin and S.T.H. Su, "Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Techniques", Proc. IEEE Int. Test Conf., pp.660-668, Oct. 1984.
    • (1984) Proc. IEEE Int. Test Conf. , pp. 660-668
    • Lin, T.1    Su, S.T.H.2
  • 11
    • 0006804687 scopus 로고
    • The S-Algorithm: A Promising Solution for Systematic Functional Test Generation
    • July
    • T. Lin and S.Y.H. Su, "The S-Algorithm: A Promising Solution for Systematic Functional Test Generation", IEEE Trans. on CAD, Vol. C-4, pp. 250-263, July, 1985.
    • (1985) IEEE Trans. on CAD , vol.C-4 , pp. 250-263
    • Lin, T.1    Su, S.Y.H.2
  • 13
    • 0026187582 scopus 로고
    • Attain Testability with Hierarchical Design
    • June
    • G.M. Nurie, "Attain Testability with Hierarchical Design", Electronic Design, pp.89-98, June, 1991.
    • (1991) Electronic Design , pp. 89-98
    • Nurie, G.M.1
  • 15
    • 0026173355 scopus 로고
    • Analysis and Refinement of Software Test Data Adequacy Properties
    • June
    • Parrish, A.; Zweben, S., H.; "Analysis and Refinement of Software Test Data Adequacy Properties" IEEE Transactions on Software Engineering SE-17, 6(June 1991), p. 565-581.
    • (1991) IEEE Transactions on Software Engineering , vol.SE-17 , Issue.6 , pp. 565-581
    • Parrish, A.1    Zweben, S.H.2
  • 16
    • 0025491545 scopus 로고
    • A Formal Model of Program Dependences and Its Implications for Software Testing, Debugging, and Maintenance
    • Sept.
    • Podgursky, A.; Clarke, L., A.; "A Formal Model of Program Dependences and Its Implications for Software Testing, Debugging, and Maintenance", IEEE Transactions on Software Engineering SE-16, 9(Sept. 1990), p. 965-979.
    • (1990) IEEE Transactions on Software Engineering , vol.SE-16 , Issue.9 , pp. 965-979
    • Podgursky, A.1    Clarke, L.A.2
  • 17
    • 17044365216 scopus 로고
    • Behavioral Test Generation Using Mixed Integer Non-Linear Programming
    • R.S. Ramchandani and D.E. Thomas, "Behavioral Test Generation Using Mixed Integer Non-Linear Programming", Proc. of Int. Test Conf., pp.958-967, 1994.
    • (1994) Proc. of Int. Test Conf. , pp. 958-967
    • Ramchandani, R.S.1    Thomas, D.E.2
  • 18
    • 84987194972 scopus 로고
    • Data Flow Analysis Techniques for Test Data Selection
    • IEEE Computer Society, Tokyo, Japan, Sept.
    • Rapps, S.; Weyuker, E., J.; "Data Flow Analysis Techniques for Test Data Selection" Procs. Sixth Int. Conf. Software Engineering, IEEE Computer Society, Tokyo, Japan, Sept. 1982, p. 272-277.
    • (1982) Procs. Sixth Int. Conf. Software Engineering , pp. 272-277
    • Rapps, S.1    Weyuker, E.J.2
  • 19
    • 0022043004 scopus 로고
    • Selecting Software Test Data using Data Flow Information
    • April
    • Rapps, S.; Weyuker, E., J.; "Selecting Software Test Data using Data Flow Information", IEEE Transactions on Software Engineering SE-11, 4(April 1985), p. 367-375.
    • (1985) IEEE Transactions on Software Engineering , vol.SE-11 , Issue.4 , pp. 367-375
    • Rapps, S.1    Weyuker, E.J.2
  • 21
    • 0019030438 scopus 로고
    • Test Generation for Microprocessors
    • June
    • S.M. Thatte and J.A. Abraham, "Test Generation for Microprocessors", IEEE Trans. on Computers, Vol.C-29, pp.429-441, June, 1990.
    • (1990) IEEE Trans. on Computers , vol.C-29 , pp. 429-441
    • Thatte, S.M.1    Abraham, J.A.2
  • 22
    • 0026989879 scopus 로고
    • Automatic Test Knowledge Extraction From VHDL (ATKET)
    • June
    • P. Vishakantaiah et. al., "Automatic Test Knowledge Extraction From VHDL (ATKET)", Proc. of the 29th Design Automation Conf., pp.273-278, June, 1992.
    • (1992) Proc. of the 29th Design Automation Conf. , pp. 273-278
    • Vishakantaiah, P.1
  • 23
    • 0022914039 scopus 로고
    • Axiomatizing Software Test Data Adequacy
    • Dec.
    • Weyuker, E.; "Axiomatizing Software Test Data Adequacy", IEEE Transactions on Software Engineering SE-12, 12(Dec. 1986), p. 1128-1138.
    • (1986) IEEE Transactions on Software Engineering , vol.SE-12 , Issue.12 , pp. 1128-1138
    • Weyuker, E.1
  • 24
    • 0024031548 scopus 로고
    • The Evaluation of Program-Based Software Test Data Adequacy Criteria
    • June
    • Weyuker, E.; "The Evaluation of Program-Based Software Test Data Adequacy Criteria", CACM 31, 6(June 1988), p. 668-675.
    • (1988) CACM , vol.31 , Issue.6 , pp. 668-675
    • Weyuker, E.1
  • 27
    • 84949651584 scopus 로고    scopus 로고
    • TransEDA Ltd., United Kingdom
    • VHDLCover Software, TransEDA Ltd., United Kingdom.
    • VHDLCover Software


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.