Tunable diode laser spectroscopy for industrial process applications: System characterization in conventional and new approaches

IEEE Sensors Journal

Volumn 8, Issue 7, 2008, Pages 1079-1088

  Johnstone, Walter ^a   McGettrick, Andrew James ^b   Duffin, Kevin ^a   Cheung, Amy ^c   Stewart, George ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b Withers and Rogers   (United Kingdom)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Diode lasers; Fiber sensors; Fuel cells; Gas sensors; Laser spectroscopy

Indexed keywords

ABSORPTION LINES; BROADENING COEFFICIENTS; CONCENTRATION (COMPOSITION); CRITICAL PARAMETERS; GAS CONCENTRATIONS; INDUSTRIAL PROCESS APPLICATIONS; LASER POWER MODULATION; LOW COST SYSTEMS; NEW APPROACHES; NEW TECHNIQUES; OPERATING CONDITIONS; RESIDUAL AMPLITUDE MODULATION (RAM); SYSTEM CHARACTERIZATION; TRANSMISSION FUNCTIONS; TUNABLE DIODE LASER SPECTROSCOPY; WIDE-RANGE;

ABSORPTION; AMPLITUDE MODULATION; CONCENTRATION (PROCESS); CURVE FITTING; FREQUENCY MODULATION; GAS ABSORPTION; GAS MIXTURES; LASER SPECTROSCOPY; LASERS; MEASUREMENTS; METHANE; NUMERICAL ANALYSIS; PULSED LASER DEPOSITION; RANDOM ACCESS STORAGE; SPECTRUM ANALYSIS;

MODULATION;

EID: 47849092776     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2008.926168     Document Type: Conference Paper

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