Experimental method based on wavelength-modulation spectroscopy for the characterization of semiconductor lasers under direct modulation

Applied Optics

Volumn 43, Issue 22, 2004, Pages 4446-4453

  Schilt, Stéphane ^a   Thévenaz, Luc ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC CURRENTS; FREQUENCY MODULATION; GAS ABSORPTION; HARMONIC ANALYSIS; LIGHT MODULATION; PARAMETER ESTIMATION; PHASE SHIFT; SIGNAL PROCESSING; SPECTROSCOPY;

ABSORPTION LINES; HARMONIC SIGNALS; INTENSITY MODULATION (IM); WAVELENGTH-MODULATION SPECTROSCOPY (WMS);

SEMICONDUCTOR LASERS;

EID: 4043073678     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.004446     Document Type: Article

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