Structure and morphology of perylene films grown on different substrates

Journal of Applied Physics

Volumn 104, Issue 1, 2008, Pages

  Beigmohamadi, M ^a   Niyamakom, P ^a   Farahzadi, A ^a   Effertz, C ^a   Kremers, S ^a   Brueggemann, D ^a,b   Wuttig, M ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON TRANSITIONS; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ATOMIC FORCE (AF); DIFFERENT SUBSTRATES; DROP SHAPE ANALYSIS (DSA); FILM PROPERTIES; MORPHOLOGICAL PROPERTIES; PERYLENE FILMS; STRUCTURE AND MORPHOLOGY; SURFACE FREE-ENERGY (SFE); X RAY DIFFRACTION (XRD);

IMAGING TECHNIQUES;

EID: 47749140744     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2951900     Document Type: Article

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