메뉴 건너뛰기




Volumn 238, Issue 1-4 SPEC. ISS., 2004, Pages 42-46

Artifacts in AFM images revealed using friction maps

Author keywords

AFM image; Friction maps; Nanoscale

Indexed keywords

FRICTION; IMAGE RETRIEVAL; LIGHT INTERFERENCE; STAINLESS STEEL; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY;

EID: 4744343145     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.185     Document Type: Conference Paper
Times cited : (12)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.