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Volumn 238, Issue 1-4 SPEC. ISS., 2004, Pages 42-46
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Artifacts in AFM images revealed using friction maps
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Author keywords
AFM image; Friction maps; Nanoscale
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Indexed keywords
FRICTION;
IMAGE RETRIEVAL;
LIGHT INTERFERENCE;
STAINLESS STEEL;
SURFACE ROUGHNESS;
SURFACE TOPOGRAPHY;
FRICTION MAPS;
FRICTIONAL IMAGES;
LATERAL FORCE MICROSCOPY (LFM);
NANOSCALE;
ATOMIC FORCE MICROSCOPY;
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EID: 4744343145
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.05.185 Document Type: Conference Paper |
Times cited : (12)
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References (16)
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