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Volumn 31, Issue 11, 2001, Pages 1027-1030
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Surface morphological characterization of yeast cells by scanning force microscopy
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Author keywords
Molecular interaction; Scanning force microscopy; Yeast cells
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Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
FRICTION;
SURFACES;
LATERAL FORCE MICROSCOPY;
SCANNING PROBE MICROSCOPY;
YEAST;
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EID: 0035506096
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1126 Document Type: Article |
Times cited : (12)
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References (35)
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