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Volumn 53, Issue 23, 2008, Pages 6978-6987

Ternary CdxZn1-xSe deposited on Ag (1 1 1) by ECALE: Electrochemical and EXAFS characterization

Author keywords

AFM; ECALE; EXAFS; Silver single crystals; Ternary CdxZn1 xSe

Indexed keywords

ATOMIC LAYER EPITAXY; CADMIUM; CADMIUM COMPOUNDS; CRYSTAL GROWTH; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; STRUCTURAL PROPERTIES;

EID: 47249094991     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2008.01.046     Document Type: Article
Times cited : (19)

References (44)
  • 18
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    • Conway B.E., White R.E., and Bockris J.OM. (Eds), Plenum Press, New York
    • Hamelin A. In: Conway B.E., White R.E., and Bockris J.OM. (Eds). Modern Aspects of Electrochemistry vol. 16 (1985), Plenum Press, New York 1
    • (1985) Modern Aspects of Electrochemistry , vol.16 , pp. 1
    • Hamelin, A.1
  • 20
    • 47249098830 scopus 로고    scopus 로고
    • T. Kurasawa, Patent Japan, 35-5619, May 23, 1960.
    • T. Kurasawa, Patent Japan, 35-5619, May 23, 1960.
  • 31
    • 47249128855 scopus 로고    scopus 로고
    • Reference guide of the Scanning Probe Image Processor (SPIP).
    • Reference guide of the Scanning Probe Image Processor (SPIP).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.