Understanding the microscopic structure of SAMs/SiO2 interfaces in the presence of water using first-principles modeling

Journal of Physical Chemistry C

Volumn 112, Issue 14, 2008, Pages 5567-5572

  Dkhissi, A ^a   Esteve, A ^a   Djafari Rouhani, M ^a   Jeloaica, L ^a  

^a UNIVERSITÉ DE TOULOUSE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; SILANES;

ATOMIC-SCALE MODELLING; MICROSCOPIC STRUCTURES; ORGANOSILANE COMPOUNDS;

SILICON COMPOUNDS;

EID: 47149084391     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp709697b     Document Type: Article

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