-
3
-
-
85008054314
-
-
Lee, K.-J.; Cho, B.-H.; Cho, W.-Y.; Kang, S.; Choi, B.-G.; Oh, H.-R.; Lee, C.-S.; Kim, H.-J.; Park, J.-M.; Wang, Q.; Park, M.-H.; Ro, Y.-H.; Choi, J.-Y.; Kim, K.-S.; Kim, Y.-R.; Shin, I.-C.; Lim, K.-W.; Cho, H.-K.; Choi, C.-H.; Chung, W.-R.; Kim, D.E.; Yoon, Y.-J.; Yu, K.-S.; Jeong, G.-T.; Jeong, H.-S.; Kwak, C.-K.; Kim, C.-H.; Kim, K. IEEE J. Solid-State Circuits 2008, 43, 150.
-
(2008)
IEEE J. Solid-State Circuits
, vol.43
, pp. 150
-
-
Lee, K.-J.1
Cho, B.-H.2
Cho, W.-Y.3
Kang, S.4
Choi, B.-G.5
Oh, H.-R.6
Lee, C.-S.7
Kim, H.-J.8
Park, J.-M.9
Wang, Q.10
Park, M.-H.11
Ro, Y.-H.12
Choi, J.-Y.13
Kim, K.-S.14
Kim, Y.-R.15
Shin, I.-C.16
Lim, K.-W.17
Cho, H.-K.18
Choi, C.-H.19
Chung, W.-R.20
Kim, D.E.21
Yoon, Y.-J.22
Yu, K.-S.23
Jeong, G.-T.24
Jeong, H.-S.25
Kwak, C.-K.26
Kim, C.-H.27
Kim, K.28
more..
-
5
-
-
47049127430
-
-
Lee, J. I.; Park, H.; Cho, S. L.; Park, Y. L.; Bae, B. J.; Park, J. H.; An, H. G.; Bae, J. S.; Ahn, D. H.; Kim, Y. T.; Horii, H.; Song, S. A.; Shin, J. C.; Park, S. O.; Kim, H. S.; Chung, U.-I.; Moon, J. T.; Ryu, B. I. VLSI Tech. Dig. 2007, 1203.
-
(2007)
VLSI Tech. Dig
, pp. 1203
-
-
Lee, J.I.1
Park, H.2
Cho, S.L.3
Park, Y.L.4
Bae, B.J.5
Park, J.H.6
An, H.G.7
Bae, J.S.8
Ahn, D.H.9
Kim, Y.T.10
Horii, H.11
Song, S.A.12
Shin, J.C.13
Park, S.O.14
Kim, H.S.15
Chung, U.-I.16
Moon, J.T.17
Ryu, B.I.18
-
6
-
-
33748479283
-
-
Kim, R.-Y.; Kim, H.-G.; Yoon, S.-G. Appl. Phys. Lett. 2006, 89, 102107.
-
(2006)
Appl. Phys. Lett
, vol.89
, pp. 102107
-
-
Kim, R.-Y.1
Kim, H.-G.2
Yoon, S.-G.3
-
7
-
-
33947127140
-
-
Choi, B. J.; Choi, S.; Shin, Y. C.; Hwang, C. S.; Lee, J. W.; Jeong, J.; Kim, Y. J.; Hwang, S.-Y.; Hongc, S. K. J. Electrochem. Soc. 2007, 154, H318.
-
(2007)
J. Electrochem. Soc
, vol.154
-
-
Choi, B.J.1
Choi, S.2
Shin, Y.C.3
Hwang, C.S.4
Lee, J.W.5
Jeong, J.6
Kim, Y.J.7
Hwang, S.-Y.8
Hongc, S.K.9
-
8
-
-
47049106565
-
-
Tompa, G. S.; Sun, S.; Rice, C. E.; Cuchiaro, J.; Dons, E. Mater. Res. Soc. Symp. 2007, 997, 110-08.
-
(2007)
Mater. Res. Soc. Symp
, vol.997
, pp. 110-208
-
-
Tompa, G.S.1
Sun, S.2
Rice, C.E.3
Cuchiaro, J.4
Dons, E.5
-
9
-
-
34548820185
-
-
Hwang, C. S.; Kim, Y. J.; Son, Y. J.; Hong, S. K. Chem. Mater. 2007, 19, 4387.
-
(2007)
Chem. Mater
, vol.19
, pp. 4387
-
-
Hwang, C.S.1
Kim, Y.J.2
Son, Y.J.3
Hong, S.K.4
-
10
-
-
33846666168
-
-
Lee, J.; Choi, S.; Lee, C.; Kang, Y.; Kim, D. Appl. Surf. Sci. 2007, 253, 3969.
-
(2007)
Appl. Surf. Sci
, vol.253
, pp. 3969
-
-
Lee, J.1
Choi, S.2
Lee, C.3
Kang, Y.4
Kim, D.5
-
11
-
-
2042516223
-
-
Choy, K.-L, Ed, Imperial College Press: London, Chapter 3, p
-
Senateur, J. P.; Dubourdieu, C.; Galindo, V.; Weiss, F.; Abrutis, A. Innovative Processing of Films and Nanocrystalline Powders; Choy, K.-L., Ed.; Imperial College Press: London, 2002; Chapter 3, p 71.
-
(2002)
Innovative Processing of Films and Nanocrystalline Powders
, pp. 71
-
-
Senateur, J.P.1
Dubourdieu, C.2
Galindo, V.3
Weiss, F.4
Abrutis, A.5
-
12
-
-
47049084714
-
-
Eds
-
Bourée, J.-E.; Mahan, A. H., Eds. Proceedings of the Fourth International Conference on Hot-Wwire CVD (Cat-CVD) Process, Takayama, Gifu, Japan; Thin Solid Films 2008, 576, 487-874.
-
(2008)
Thin Solid Films, Proceedings of the Fourth International Conference on Hot-Wwire CVD (Cat-CVD) Process, Takayama, Gifu, Japan
, vol.576
, pp. 487-874
-
-
-
13
-
-
38849098341
-
-
Siegel, J.; Gawelda, W.; Puerto, D.; Dorronsoro, C.; Solis, J.; Afonso, C. N.; De Sande, J. C. G.; Bez, R.; Pirovano, A.; Wiemer, C. J. Appl. Phys. 2008, 103, 023516.
-
(2008)
J. Appl. Phys
, vol.103
, pp. 023516
-
-
Siegel, J.1
Gawelda, W.2
Puerto, D.3
Dorronsoro, C.4
Solis, J.5
Afonso, C.N.6
De Sande, J.C.G.7
Bez, R.8
Pirovano, A.9
Wiemer, C.10
-
14
-
-
41149134446
-
-
Honolulu, HI, June 13-15, Institute of Electrical and Electronics Engineers: Piscataway, NJ
-
Pellizzer, F.; Benvenuti, A.; Gleixner, B.; Kim, Y.; Johnson, B.; Magistretti, M.; Marangon, T.; Pirovano, A.; Bez, R.; Atwood, G. Symposium on VLSI Technology, Honolulu, HI, June 13-15, 2006; Institute of Electrical and Electronics Engineers: Piscataway, NJ, 2006; p 122.
-
(2006)
Symposium on VLSI Technology
, pp. 122
-
-
Pellizzer, F.1
Benvenuti, A.2
Gleixner, B.3
Kim, Y.4
Johnson, B.5
Magistretti, M.6
Marangon, T.7
Pirovano, A.8
Bez, R.9
Atwood, G.10
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