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Volumn 2, Issue 4, 2008, Pages 733-742

Polyoxometalate-based layered structures for charge transport control in molecular devices

Author keywords

Hybrid molecular materials; Layer by layer self assembly method; Molecular electronics; Monolayers; Polyoxometalates

Indexed keywords

LITHOGRAPHY;

EID: 46849110368     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn700333j     Document Type: Article
Times cited : (118)

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    • The process conditions in the (a - c) cases of Figure 1 were the optimal conditions found: POM 0.1 M, aq, pH 0.5, rt, 20 min (rinsing: HCI 0.3 M, aq, pH 0.5); DD 0.01 M, aq, HCI 0.3 M, pH 0.5, rt, 20 min (rinsing: HCI 0.3 M, aq, pH 0.5). The POM-based multilayers were fabricated on an APTES adhesion layer.
    • The process conditions in the (a - c) cases of Figure 1 were the optimal conditions found: POM 0.1 M, aq, pH 0.5, rt, 20 min (rinsing: HCI 0.3 M, aq, pH 0.5); DD 0.01 M, aq, HCI 0.3 M, pH 0.5, rt, 20 min (rinsing: HCI 0.3 M, aq, pH 0.5). The POM-based multilayers were fabricated on an APTES adhesion layer.
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    • More details about the XPS spectra obtained are the following: The kinetic energy of the photoelectrons was determined with the hemispheric analyser set to the pass energy of 160 eV for wide scan spectra and 20 eV for high resolution spectra. The electrostatic charge effect of the sample was overcompensated by means of the low-energy electron source working in combination with a magnetic immersion lens. Quantitative elemental compositions were determined from peak areas using experimentally determined sensitivity factors and the spectrometer transmission function. Spectrum background was subtracted according to Shirley. The high resolution spectra were analysed by means of spectra cleconvolution software (Vision 2, Kratos Analytical, U.K.).
    • More details about the XPS spectra obtained are the following: The kinetic energy of the photoelectrons was determined with the hemispheric analyser set to the pass energy of 160 eV for wide scan spectra and 20 eV for high resolution spectra. The electrostatic charge effect of the sample was overcompensated by means of the low-energy electron source working in combination with a magnetic immersion lens. Quantitative elemental compositions were determined from peak areas using experimentally determined sensitivity factors and the spectrometer transmission function. Spectrum background was subtracted according to Shirley. The high resolution spectra were analysed by means of spectra cleconvolution software (Vision 2, Kratos Analytical, U.K.).
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    • The take-off angle is defined as the angle between the normal to the surface of the sample and the electron optical axis of the spectrometer. The effective information depth, varies according to d, do cos θ, where do is the maximum information depth do ≈ 10 nm for the C1s line by employing an Al Kα source
    • o ≈ 10 nm for the C1s line by employing an Al Kα source).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.