Electron diffraction based analysis of phase fractions and texture in nanocrystalline thin films, part I: Principles

Microscopy and Microanalysis

Volumn 14, Issue 4, 2008, Pages 287-295

  Lábár, János L ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Nanocrystals; Phase fractions; Quantitative analysis; Ring patterns; SAED; Selectron diffraction; TEM; Texture; Thin films

Indexed keywords

EID: 46749142567     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608080380     Document Type: Article

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