Uncertainty of atomic force microscopy measurements

Optica Applicata

Volumn 37, Issue 4, 2007, Pages 397-404

  Gotszalk, Teodor P ^a   Janus, Pawel ^b   Marendziak, Andrzej ^a   Szeloch, Roman F ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

Atomic force microscopy (AFM); Uncertainty of measurement

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CONTROL SYSTEMS; MEASUREMENTS; MICROSCOPIC EXAMINATION; SPACE PROBES; UNCERTAINTY ANALYSIS;

(P ,P ,T) MEASUREMENTS; ATOMIC FORCE (AF); ATOMIC FORCE MICROSCOPY (AFM); CANTILEVER TIPS; DYNAMIC BEHAVIORS; LINEAR MEASUREMENTS; MEASUREMENT AND CONTROL; QUANTUM PHENOMENA; SAMPLE SURFACES; SCANNING PROBE MICROSCOPY (SPM); TWO DIMENSIONS;

SCANNING PROBE MICROSCOPY;

EID: 46649118858     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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