Functional test selection for high volume manufacturing

Proceedings - International Workshop on Microprocessor Test and Verification

Volumn , Issue , 2006, Pages 15-19

  Gangaram, Vijay ^a   Bhan, Deepa ^a   Caldwell, James K ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Design validation; Fault simulation acceleration; Functional test sequences; Test sequence compaction; Untestable fault identification

Indexed keywords

GRADING;

DESIGN VALIDATION; FAULT SIMULATION ACCELERATION; FUNCTIONAL TEST SEQUENCES; TEST SEQUENCE COMPACTION; UNTESTABLE FAULT IDENTIFICATION;

MANUFACTURE;

EID: 46449100680     PISSN: 15504093     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MTV.2006.12     Document Type: Conference Paper

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