Coverage of formal properties based on a high-level fault model and functional ATPG

Proceedings of the 10th IEEE European Test Symposium, ETS 2005

Volumn 2005, Issue , 2005, Pages 162-167

  Fummi, Franco ^a   Pravadelli, Graziano ^a   Toto, Franco ^b  

^a UNIVERSITY OF VERONA   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS); MATHEMATICAL MODELS;

DIGITAL SYSTEMS; FUNCTIONAL ATPG;

ELECTRIC FAULT CURRENTS;

EID: 33744492102     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2005.12     Document Type: Conference Paper

References (10)

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