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Volumn 103, Issue 12, 2008, Pages

Atomic-scale analysis of defect dynamics and strain relaxation mechanisms in biaxially strained ultrathin films of face-centered cubic metals

Author keywords

[No Author keywords available]

Indexed keywords

(1 1 0) SURFACE; APPLIED (CO); ATOMIC-SCALE ANALYSIS; BIAXIAL STRAINING; BIAXIAL TENSILE; COMPUTATIONAL ANALYSES; CRYSTALLOGRAPHIC DIRECTIONS; CU(TI) FILM; DEFECT DYNAMICS; ELASTIC RESPONSE]; FACE-CENTERED-CUBIC (FCC) METALS; MECHANICAL RESPONSES; MOLECULAR-DYNAMICS (MD) SIMULATIONS; PARAMETRIZATION; RELAXATION MECHANISMS; STRAIN RANGES; SUPERCELLS; SYSTEMATIC (CO); THICKNESS OF THE FILM; THREADING DISLOCATION (TD); VACANCY CLUSTERING; YIELD STRAIN;

EID: 46449096020     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2938022     Document Type: Article
Times cited : (21)

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