Relaxation of biaxial tensile strain in ultrathin metallic films: Ductile void growth versus nanocrystalline domain formation

Applied Physics Letters

Volumn 87, Issue 17, 2005, Pages 1-3

  Gungor, M Rauf ^a   Maroudas, Dimitrios ^a  

^a University of Massachusetts   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TENSILE STRAIN; ULTRATHIN METALLIC FILMS;

MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; STRAIN RATE; TENSILE STRENGTH; X RAY CRYSTALLOGRAPHY;

ULTRATHIN FILMS;

EID: 28344443550     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2108128     Document Type: Article

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