Thickness dependence of the dielectric function of ferroelectric thin films

Physica Status Solidi (B) Basic Research

Volumn 241, Issue 5, 2004, Pages 1141-1148

  Wesselinowa, J M ^a   Trimper, S ^b  

^a UNIVERSITY OF SOFIA   (Bulgaria)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4644334622     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200301988     Document Type: Article

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