Via and reference discontinuity impact on high-speed signal integrity

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 2004, Pages 583-587

  Kim, Jingook ^a   Kim, Joungho ^a   Rotaru, Mihai Dragos ^b   Chong, Kok Chin ^b   Iyer, Mahadevan K ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

Noise coupling; Refrence discontinuity; Via transition

Indexed keywords

BOUNDARY CONDITIONS; DIGITAL CIRCUITS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTROMAGNETIC FIELDS; FINITE DIFFERENCE METHOD; METALLIZING; METHOD OF MOMENTS; SPURIOUS SIGNAL NOISE; STANDBY POWER SYSTEMS; SWITCHING SYSTEMS; TIME DOMAIN ANALYSIS;

HIGH SPEED DIGITAL SYSTEMS; NOISE COUPLING; REFERENCE DISCONTINUTIY; VIA TRANSITION;

SIGNAL PROCESSING;

EID: 4644318460     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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