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Volumn 51, Issue 3, 1999, Pages 249-256

Build-up modification of commercial diodes for entrance dose measurements in 'higher energy' photon beams

Author keywords

Electron contamination; Entrance dose measurements; In vivo dosimetry

Indexed keywords

COPPER; IRON; LEAD;

EID: 0033010139     PISSN: 01678140     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8140(99)00058-4     Document Type: Article
Times cited : (31)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.