SCOPUS 정보 검색 플랫폼

Volumn 36, Issue 9, 2004, Pages 1304-1313

Mathematical topographical correction of XPS images using multivariate statistical methods

(2) Artyushkova, Kateryna a Fulghum, Julia E a

a University of New Mexico (United States)

Author keywords

Multicomponent rough sample; Multivariate image analysis; PCA; Photoelectron imaging; Polymer blend; Simplisma; Topographical background correction; XPS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; CORRELATION METHODS; IMAGE ANALYSIS; MIXTURES; POLYMER BLENDS; PRINCIPAL COMPONENT ANALYSIS; SURFACE TOPOGRAPHY;

MULTICOMPONENT ROUGH SAMPLE; MULTIVARIATE IMAGE ANALYSIS; PHOTOELECTRON IMAGING; SIMPLISMA; TOPOGRAPHICAL BACKGROUND CORRECTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 4644301511 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1841 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.