Growth and oxidation of ultra-thin Al films on the Re (0001) surface

Surface Science

Volumn 365, Issue 2, 1996, Pages 337-352

  Wu, Yutong ^a   Garfunkel, Eric ^a   Madey, Theodore E ^a  

^a NONE

Author keywords

Aluminium; Aluminium Oxide; Insulating films; Low energy ion scattering (LEIS); Metal insulator interfaces; X ray photoelectron spectroscopy

Indexed keywords

ALUMINA; ALUMINUM; ANNEALING; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; IONS; MONOLAYERS; OXIDATION; SCATTERING; SURFACES; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; LOW ENERGY ION SCATTERING;

RHENIUM;

EID: 0030244201     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00699-1     Document Type: Article

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