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Volumn 305, Issue 1-3, 2004, Pages 141-153

First infrared spectroscopic characterization of the disilyl (Si 2H 5) and d5-disilyl (Si 2D 5) radicals in low temperature silane matrices

Author keywords

[No Author keywords available]

Indexed keywords

SILANE; SILICON; SILICON DERIVATIVE;

EID: 4644265520     PISSN: 03010104     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemphys.2004.05.035     Document Type: Article
Times cited : (9)

References (44)
  • 32
    • 84862437396 scopus 로고    scopus 로고
    • Available from: http://webbook.nist.gov/chemistry/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.