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Volumn 237, Issue 1-4, 2004, Pages 110-114

Tl overlayers on Si(1 0 0) and their self-assembly induced by STM tip

Author keywords

Atom solid interactions; Morphology; Roughness; Scanning tunneling microscopy (STM); Silicon; Surface structure; Thallium; Topography

Indexed keywords

ADSORPTION; CHARGE TRANSFER; DEPOSITION; ELECTROSTATICS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SURFACE STRUCTURE; THALLIUM;

EID: 4644244096     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.07.024     Document Type: Conference Paper
Times cited : (8)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.