|
Volumn 237, Issue 1-4, 2004, Pages 110-114
|
Tl overlayers on Si(1 0 0) and their self-assembly induced by STM tip
|
Author keywords
Atom solid interactions; Morphology; Roughness; Scanning tunneling microscopy (STM); Silicon; Surface structure; Thallium; Topography
|
Indexed keywords
ADSORPTION;
CHARGE TRANSFER;
DEPOSITION;
ELECTROSTATICS;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SELF ASSEMBLY;
SURFACE STRUCTURE;
THALLIUM;
ATOM-SOLID INTERACTIONS;
DUAL-POLARITY;
TOPOGRAPHY;
TUNNELING CURRENT;
SILICON COMPOUNDS;
|
EID: 4644244096
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.07.024 Document Type: Conference Paper |
Times cited : (8)
|
References (15)
|