Sample holder assembly covering a wide range of temperatures for surface x-ray diffraction

Applied Surface Science

Volumn 237, Issue 1-4, 2004, Pages 641-644

  Tajiri, H ^a   Sumitani, K ^a   Nakatani, S ^a   Takahashi, T ^a   Akimoto, K ^b   Sugiyama, H ^c   Zhang, X ^c   Kawata, H ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Reconstructed Surface; Silicon; Surface structure; X ray diffraction

Indexed keywords

BORON; COOLING; HELIUM; PYROMETERS; REFRIGERATORS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE STRUCTURE; TANTALUM; TEMPERATURE DISTRIBUTION; VACUUM;

ATOMIC STRUCTURES; CRYSTAL SURFACES; RECONSTRUCTED SURFACES; SURFACE STRUCTURES;

X RAY DIFFRACTION ANALYSIS;

EID: 4644220004     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.07.031     Document Type: Conference Paper

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