Reduction of control-chart signal variablity for high-quality processes

Journal of Applied Statistics

Volumn 35, Issue 6, 2008, Pages 671-679

  Lai, C D ^a   Govindaraju, K ^a  

^a MASSEY UNIVERSITY   (New Zealand)

Author keywords

Attribute control chart; False alarm; High quality; Run length variability

Indexed keywords

EID: 46249109790     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760801921232     Document Type: Article

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