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Volumn 19, Issue 2, 2004, Pages 175-184

Run Length Variability and Three Sigma Control Limits

Author keywords

Average Run Length; Control Chart; Three Sigma Limit

Indexed keywords


EID: 34547314883     PISSN: 23672390     EISSN: 23672404     Source Type: Journal    
DOI: 10.1515/EQC.2004.175     Document Type: Article
Times cited : (6)

References (14)
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  • 6
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    • The Run Length Distribution of the CUSUM with Estimated Parameters
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    • Jones, L.A.1    Champ, C.W.2    Rigdon, S.E.3
  • 7
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    • A Conditional Decision Procedure for High Yield Processes
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    • Kuralmani, V.1    Xie, M.2    Goh, T.N.3    Gan, F.F.4
  • 8
    • 14544285366 scopus 로고    scopus 로고
    • Efficient Estimation of Control Chart Parameters
    • Lenz, H-J.; Wilrich, P-T. Eds., Springer
    • Ryan, T. P. (1997): Efficient Estimation of Control Chart Parameters. Frontiers in Statistical Quality Control. Vol. 5, Lenz, H-J.; Wilrich, P-T. Eds., Springer.
    • (1997) Frontiers in Statistical Quality Control. , vol.5
    • Ryan, T.P.1
  • 9
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    • Ryan, T.P.1
  • 10
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    • Economic Statistical Control-chart Designs with an Appli-fi cation to Xand R Charts
    • Saniga, E. M. (1989): Economic Statistical Control-chart Designs with an Appli-fi cation to Xand R Charts, Technometrics 31, 313-320.
    • (1989) Technometrics , vol.31 , pp. 313-320
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  • 11
    • 0043243940 scopus 로고    scopus 로고
    • Discussion of Woodall, W. H. (2000), Controversies and Contradictions in Statistical Process Control
    • Wheeler, D. J. (2000): Discussion of Woodall, W. H. (2000), Controversies and Contradictions in Statistical Process Control, Journal of Quality Technology, 32, 361-363.
    • (2000) Journal of Quality Technology , vol.32 , pp. 361-363
    • Wheeler, D.J.1
  • 13
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    • The Statistical Design of Quality Control Charts
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  • 14
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    • Controversies and Contradictions in Statistical Process Control, (with discussion)
    • Woodall, W. H. (2000): Controversies and Contradictions in Statistical Process Control, (with discussion), Journal of Quality Technology, 32, 341-378.
    • (2000) Journal of Quality Technology , vol.32 , pp. 341-378
    • Woodall, W.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.