A synthetic control chart for detecting small shifts in the process mean

Journal of Quality Technology

Volumn 32, Issue 1, 2000, Pages 32-38

  Wu, Zhang ^a   Spedding, Trevor A ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Average run length; Control charts; X

Indexed keywords

EID: 0038385684     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2000.11979969     Document Type: Article

References (13)

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