Tetra-σ bonding adsorption of pyridine on Si(1 0 0)-2 × 1

Journal of Electron Spectroscopy and Related Phenomena

Volumn 164, Issue 1-3, 2008, Pages 44-47

  Lee, Han Koo ^a   Kim, Ki jeong ^b,c   Kang, Tai Hee ^b   Kim, Sehun ^c   Chung, J W ^a   Kim, Bongsoo ^a,b  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b POSTECH   (South Korea)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Adsorption; Functionalization; Modification; Molecular orientation; NEXAFS; Organic semiconductor interface; PES; Pyridine; Si(1 0 0)

Indexed keywords

ADSORPTION; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; AUGER ELECTRON SPECTROSCOPY; CHEMISORPTION; COMPUTER NETWORKS; EMISSION SPECTROSCOPY; METAL CLADDING; MICROFLUIDICS; PYRIDINE; SILICON; SURFACE PHENOMENA; X RAY ANALYSIS; X RAY SPECTROSCOPY;

(1 1 0) SURFACE; ADSORPTION ANGLE; ADSORPTION GEOMETRIES; ANALYTICAL SOLUTIONS; ANGLE DEPENDENCE; BONDED STRUCTURES; C ATOMS; DOUBLE BONDS; ELSEVIER (CO); HIGH-RESOLUTION PHOTOEMISSION SPECTROSCOPY; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE (NEXAFS) SPECTRA; NEAR EDGE X RAY ADSORPTION FINE STRUCTURE (NEXAFS); ORBITAL (CO); PARTIAL ELECTRON YIELD (PEY); ROOM-TEMPERATURE (RT); SI(1 0 0 ); SPECTRA (CO);

CRYSTAL ATOMIC STRUCTURE;

EID: 45949110205     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2008.05.005     Document Type: Article

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