Adsorption configuration of pyrrole (C4H4NH) on Si(1 0 0)-2 × 1 by using PES and angle resolved NEXAFS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 429-431

  Kim, Ki Jeong ^a   Han, Jinhee ^c   Kang, Tai Hee ^a   Ihm, Kyuwook ^a   Jeon, C ^b   Moon, Sangwoon ^a   Hwang, Chan Cuk ^a   Hwang, Han Na ^a   Kim, Bongsoo ^a  

^a POSTECH   (South Korea)

^b Sungkyunkwan University   (South Korea)

^c Pohang Accelerator Laboratory ^*

Author keywords

NEXAFS; Photoemission spectroscopy; Pyrrole; Si(1 0 0)

Indexed keywords

CHEMICAL BONDS; DNA; ELECTRONIC STRUCTURE; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MICROELECTRONICS; PHOTOEMISSION; SPECTROSCOPIC ANALYSIS;

NEXAFS; PHOTOEMISSION SPECTROSCOPY; PYRROLE; SI(100);

SILICON;

EID: 17444421939     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.029     Document Type: Conference Paper

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