Evolution of an amorphous silicon network from silicon paracrystallites studied by spectroscopic ellipsometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 23, 2004, Pages

  Hazra, Sukti ^a,b   Sakata, Isao ^a   Yamanaka, Mitsuyuki ^a   Suzuki, Eiichi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; SILICON;

ARTICLE; COMPUTER PROGRAM; CRYSTAL STRUCTURE; ELLIPSOMETRY; ENERGY; FILM; HYDROGENATION; SEMICONDUCTOR; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 45849154485     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.235204     Document Type: Article

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